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Anti-patterns in modern code review: Symptoms and prevalence

Chouchen, Moataz, Ouni, Ali, Kula, Raula Gaikovina, Wang, Dong, Thongtanunam, Patanamon, Mkaouer, Mohamed Wiem et Matsumoto, Kenichi. 2021. « Anti-patterns in modern code review: Symptoms and prevalence ». In IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER) (Honolulu, HI, USA, Mar. 09-12, 2021) pp. 531-535. IEEE.

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Item Type: Conference proceeding
Professor:
Professor
Ouni, Ali
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 08 Jun 2021 19:28
Last Modified: 08 Jun 2021 19:28
URI: https://espace2.etsmtl.ca/id/eprint/22797

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