Characterization of room-temperature processed thin film capacitors under curvature

Schell, E. V., Shih, Andy and Akinwande, A. I.. 2018. « Characterization of room-temperature processed thin film capacitors under curvature ». In MTL Annual Research Report 2018 : Section : Electronic, Magnetic, Superconducting, and Neuromorphic Devices. p. 122. Massachusetts Institute of Technology.

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Item Type:	Book chapter
Additional Information:	Résumé de recherche.
Professor:	Professor Shih, Andy
Affiliation:	Autres
Date Deposited:	04 Oct 2021 17:52
Last Modified:	04 Oct 2021 17:52
URI:	https://espace2.etsmtl.ca/id/eprint/23270

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