Baseline cortical thickness reductions in clinical high risk for psychosis: Brain regions associated with conversion to psychosis versus non-conversion as assessed at one-year follow-up in the shanghai-at-risk-for-psychosis (SHARP) study

Del Re, E. C., Stone, W. S., Bouix, S., Seitz, J., Zeng, V., Guliano, A., Somes, N., Zhang, T., Reid, B., Lyall, A., Lyons, M., Li, H., Whitfield-Gabrieli, S., Keshavan, M., Seidman, L. J., McCarley, R. W., Wang, J., Tang, Y., Shenton, M. E. and Niznikiewicz, M. A.. 2021. « Baseline cortical thickness reductions in clinical high risk for psychosis: Brain regions associated with conversion to psychosis versus non-conversion as assessed at one-year follow-up in the shanghai-at-risk-for-psychosis (SHARP) study ». Schizophrenia Bulletin, vol. 47, nº 2. pp. 562-574.
Compte des citations dans Scopus : 28.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Bouix, Sylvain
Affiliation:	Autres
Date Deposited:	22 Jun 2022 17:11
Last Modified:	22 Jun 2022 17:11
URI:	https://espace2.etsmtl.ca/id/eprint/24637

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