Mendes, Eduardo et Petrillo, Fabio.
2021.
« Log severity levels matter: A multivocal mapping ».
In IEEE 21st International Conference on Software Quality, Reliability and Security (QRS) (Hainan, China, Dec. 06-10, 2021)
pp. 1002-1013.
Institute of Electrical and Electonics Engineers.
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Official URL: https://doi.org/10.1109/QRS54544.2021.00109
| Item Type: | Conference proceeding |
|---|---|
| ISBN: | 2693-9177 |
| Professor: | Professor Petrillo, Fabio |
| Affiliation: | Autres |
| Date Deposited: | 06 Jul 2022 21:29 |
| Last Modified: | 06 Jul 2022 21:29 |
| URI: | https://espace2.etsmtl.ca/id/eprint/24872 |
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