End-to-end deep learning framework for printed circuit board manufacturing defect classification

Bhattacharya, Abhiroop et Cloutier, Sylvain G.. 2022. « End-to-end deep learning framework for printed circuit board manufacturing defect classification ». Scientific Reports, vol. 12, nº 1.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Cloutier, Sylvain G.
Affiliation:	Génie électrique
Date Deposited:	24 Aug 2022 18:35
Last Modified:	24 Aug 2022 18:35
URI:	https://espace2.etsmtl.ca/id/eprint/25093

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