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A low-cost, minimally-invasive embedded monitoring method for early detection of transistor on-state resistance degradation in power electronics systems

Piraghaj, Sudabeh Piraghaj et Constantin, Nicolas G.. 2022. « A low-cost, minimally-invasive embedded monitoring method for early detection of transistor on-state resistance degradation in power electronics systems ». In 20th IEEE Interregional NEWCAS Conference (IEEE NEWCAS) (Quebec City, QC, Canada, June 19-22, 2022) pp. 352-356. IEEE.

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Item Type: Conference proceeding
ISBN: 978-1-6654-0105-0
Professor:
Professor
Constantin, Nicolas
Affiliation: Génie électrique
Date Deposited: 17 Oct 2022 14:00
Last Modified: 17 Oct 2022 14:00
URI: https://espace2.etsmtl.ca/id/eprint/25649

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