Piraghaj, Sudabeh Piraghaj and Constantin, Nicolas G..
2022.
« A low-cost, minimally-invasive embedded monitoring method for early detection of transistor on-state resistance degradation in power electronics systems ».
In 20th IEEE Interregional NEWCAS Conference (IEEE NEWCAS) (Quebec City, QC, Canada, June 19-22, 2022)
pp. 352-356.
IEEE.
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Official URL: https://doi.org/10.1109/NEWCAS52662.2022.9842075
Item Type: | Conference proceeding |
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ISBN: | 978-1-6654-0105-0 |
Professor: | Professor Constantin, Nicolas |
Affiliation: | Génie électrique |
Date Deposited: | 17 Oct 2022 14:00 |
Last Modified: | 17 Oct 2022 14:00 |
URI: | https://espace2.etsmtl.ca/id/eprint/25649 |
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