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Fast detection of power transistor faults in SRM drives based on transient pulse injection

Ali, Nasir, Wang, Qingsong, Gao, Qiang and Ma, Ke. 2023. « Fast detection of power transistor faults in SRM drives based on transient pulse injection ». IEEE Journal of Emerging and Selected Topics in Power Electronics, vol. 11, nº 5. pp. 5256-5267.
Compte des citations dans Scopus : 2.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Wang, Qingsong
Affiliation: Génie électrique
Date Deposited: 08 Aug 2023 14:32
Last Modified: 16 Nov 2023 16:06
URI: https://espace2.etsmtl.ca/id/eprint/27257

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