Use of structural tests in RTL verification

Hobeika, Christelle, Thibeault, Claude and Boland, Jean-François. 2008. « Use of structural tests in RTL verification ». In 1st Microsystems and Nanoelectronics Research Conference (MNRC) (Ottawa, Canada, Oct. 15, 2008) pp. 133-136. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type:	Conference proceeding
ISBN:	978-1-4244-2920-2
Professor:	Professor Thibeault, Claude Boland, Jean-François
Affiliation:	Génie électrique
Date Deposited:	30 Oct 2012 18:18
Last Modified:	05 Apr 2018 15:08
URI:	https://espace2.etsmtl.ca/id/eprint/2757

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