Retroactive terahertz displacement sensor in a standard 65nm CMOS technology

Al Hadi, Richard, Zhao, Yan, Li, Yilei, Du, Yuan and Chang, M. C. Frank. 2016. « Retroactive terahertz displacement sensor in a standard 65nm CMOS technology ». In CLEO: Science and Innovations (San Jose, CA, USA, June 05-10, 2016) Optica Publishing Group (formerly OSA).

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Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Autres
Date Deposited:	05 Jun 2024 13:27
Last Modified:	05 Jun 2024 13:27
URI:	https://espace2.etsmtl.ca/id/eprint/28705

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