Terahertz imaging detectors in a 65-nm CMOS SOI technology

Öjefors, Erik, Baktash, Neda, Zhao, Yan, Al Hadi, Richard, Sherry, Hani and Pfeiffer, Ullrich R.. 2010. « Terahertz imaging detectors in a 65-nm CMOS SOI technology ». In 36th European Solid State Circuits Conference ESSCIRC (Seville, Spain, Sept. 14-16, 2010) pp. 486-489. Institute of Electrical and Electonics Engineers.
Compte des citations dans Scopus : 72.

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Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Autres
Date Deposited:	05 Jun 2024 13:24
Last Modified:	05 Jun 2024 13:24
URI:	https://espace2.etsmtl.ca/id/eprint/28720

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