Thibeault, Claude.
2006.
« Improving digital IC testing with analog circuits ».
In IEEE North-East Workshop on Circuits and Systems (NEWCAS) (Gatineau, Que., Canada, June 18-21, 2006)
pp. 285-288.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 3.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/NEWCAS.2006.250948
Item Type: | Conference proceeding | ||
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ISBN: | 1-4244-0416-9 | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 30 Oct 2012 18:19 | ||
Last Modified: | 30 Oct 2012 18:19 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/2942 |
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