Improving digital IC testing with analog circuits

Thibeault, Claude. 2006. « Improving digital IC testing with analog circuits ». In IEEE North-East Workshop on Circuits and Systems (NEWCAS) (Gatineau, Que., Canada, June 18-21, 2006) pp. 285-288. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 3.

The full text of this document is not available here.

Item Type:	Conference proceeding
ISBN:	1-4244-0416-9
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/2942

Actions (login required)

View Item