On a new outlier rejection technique

Thibeault, Claude. 2007. « On a new outlier rejection technique ». In IEEE VLSI Test Symposium (Berkeley, CA, USA, May 6-10, 2007) pp. 97-103. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type:	Conference proceeding
ISBN:	0-7695-2812-0
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/2943

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