Inverted scanning microwave microscopy of GaN/AlN high-electron mobility transistors

Wang, Xiaopeng, Nomoto, Kazuki, Fabi, Gianluca, Hadi, Richard Al, Farina, Marco, Jena, Debdeep, Xing, Huili Grace and Hwang, James C. M.. 2024. « Inverted scanning microwave microscopy of GaN/AlN high-electron mobility transistors ». In 103rd ARFTG Microwave Measurement Conference (ARFTG) (Washington, DC, USA, June 21, 2024) IEEE.
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Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Génie électrique
Date Deposited:	18 Oct 2024 20:28
Last Modified:	22 Sep 2025 12:49
URI:	https://espace2.etsmtl.ca/id/eprint/29662

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