On the test-time zero-shot generalization of vision-language models: Do we really need prompt learning?

Zanella, Maxime and Ben Ayed, Ismail. 2024. « On the test-time zero-shot generalization of vision-language models: Do we really need prompt learning? ». In IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (Seattle, WA, USA, June 16-22, 2024) pp. 23783-23793. Institute of Electrical and Electonics Engineers Inc..
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Item Type:	Conference proceeding
ISBN:	979-8-3503-5300-6
Professor:	Professor Ben Ayed, Ismail
Affiliation:	Génie des systèmes
Date Deposited:	13 Feb 2025 16:45
Last Modified:	13 Feb 2025 16:45
URI:	https://espace2.etsmtl.ca/id/eprint/30519

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