Guner, Bugrahan, Safikhani-Mahmoudi, Mohammad, Li, Fengmiao, Zou, Ke et Dagdeviren, Omur E..
2025.
« Ultraviolet irradiation penetration depth on TiO2 ».
Communications Chemistry, vol. 8, nº 1.
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Résumé
High-energy ultraviolet (UVC) irradiation of metal oxides (MOs, e.g., TiO2) results in photoinduced surface oxygen vacancies (PI-SOVs), which can change the charge carrier (e.g., electrons and holes) migration dynamics. Although PI-SOVs alter the electronic and chemical properties of MOs, there is no consensus on the penetration depth of theUVCirradiation,which induces PI-SOVs and is an important variable for the design and operation of MO-based systems. Here, we performed optical transmission and time-resolved atomic force microscopy measurements on back-illuminated TiO2 samples. Our experiments show that the effect ofUVCirradiation onMOs can be observed hundreds of micrometers across the bulk, i.e., orders of magnitude larger than previously postulated values.We believe that our findings would be important both for the fundamental understanding of UVC irradiation/penetration and for device design/fabrication processes.
| Type de document: | Article publié dans une revue, révisé par les pairs |
|---|---|
| Professeur: | Professeur Dagdeviren, Omur |
| Affiliation: | Génie mécanique |
| Date de dépôt: | 31 mars 2025 18:11 |
| Dernière modification: | 10 avr. 2025 15:30 |
| URI: | https://espace2.etsmtl.ca/id/eprint/30700 |
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