Evolution of slot partial discharges under electrical, thermal and mechanical stresses

Lévesque, M., Hudon, C., Belec, M. and David, Éric. 2008. « Evolution of slot partial discharges under electrical, thermal and mechanical stresses ». In Conference Record of the 2008 IEEE International Symposium on Electrical Insulation (ISEI) (Vancouver, Canada, June 9-12, 2008) pp. 153-157. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
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Item Type:	Conference proceeding
ISBN:	978-1-4244-2091-9
Professor:	Professor David, Éric
Affiliation:	Génie mécanique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/3083

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