Dielectric characterization of high density polyethylene/SiO2 nanocomposites

Sami, A., David, Éric and Fréchette, Michel F.. 2009. « Dielectric characterization of high density polyethylene/SiO2 nanocomposites ». In IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (Virginia Beach, VA, USA, Oct. 18-21, 2009) pp. 689-692. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 7.

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Item Type:	Conference proceeding
ISBN:	9781424445592
Professor:	Professor David, Éric
Affiliation:	Génie mécanique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/3108

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