Characterization and polarization sensitivity analysis of CMOS terahertz detector

Ahmad, Redwan, Blanchard, François and Al Hadi, Richard. 2025. « Characterization and polarization sensitivity analysis of CMOS terahertz detector ». In Photonics North (PN) (Ottawa, ON, Canada, May 20-23, 2025) Piscataway, NJ, USA : IEEE.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Blanchard, François Al Hadi, Richard
Affiliation:	Génie électrique, Génie électrique
Date Deposited:	23 Oct 2025 16:05
Last Modified:	23 Oct 2025 16:05
URI:	https://espace2.etsmtl.ca/id/eprint/32611

Actions (login required)

View Item