Using fourier analyses to enhance IC testability

Thibeault, Claude. 1995. « Using fourier analyses to enhance IC testability ». Journal of Microelectronic Systems Integration, vol. 3, nº 2. pp. 83-96.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	19 Feb 2013 16:26
Last Modified:	19 Feb 2013 16:26
URI:	https://espace2.etsmtl.ca/id/eprint/3585

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