Hobeika, Christelle, Thibeault, Claude et Boland, Jean-François. 2009. « Automatic verification methodology based on structural test patterns ». Affiche présentée lors de la conférence : 27th VLSI Test Symposium (IEEE VTS) (Santa Cruz, Calif., USA, May 3-7, 2009).
The full text of this document is not available here.| Item Type: | Poster |
|---|---|
| Additional Information: | Honneur : Best Student Poster Award |
| Professor: | Professor Thibeault, Claude Boland, Jean-François |
| Affiliation: | Génie électrique |
| Date Deposited: | 18 Apr 2013 19:01 |
| Last Modified: | 05 Apr 2018 15:08 |
| URI: | https://espace2.etsmtl.ca/id/eprint/3975 |
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