Hobeika, Christelle, Thibeault, Claude et Boland, Jean-François.
2009.
« Automatic verification methodology based on structural test patterns ».
Affiche présentée lors de la conférence :
27th VLSI Test Symposium (IEEE VTS) (Santa Cruz, Calif., USA, May 3-7, 2009).
The full text of this document is not available here.
| Item Type: |
Poster
|
| Additional Information: |
Honneur : Best Student Poster Award |
| Professor: |
| Thibeault, Claude | | Boland, Jean-François |
|
| Affiliation: |
Génie électrique |
| Date Deposited: |
18 Apr 2013 19:01 |
| Last Modified: |
05 Apr 2018 15:08 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/3975 |
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