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Bidirectional influence of defects and functional size

Trudel, Sylvie et Abran, Alain. 2011. « Bidirectional influence of defects and functional size ». In Joint Conference of the 21st International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement (IWSM-MENSURA) (Nara, Japan, Nov. 3-4, 2011) pp. 69-75. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
ISBN: 978-1-4577-1930-1
Professor:
Professor
Abran, Alain
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 18 Apr 2013 19:02
Last Modified: 18 Apr 2013 19:02
URI: https://espace2.etsmtl.ca/id/eprint/4142

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