Trudel, Sylvie et Abran, Alain.
2011.
« Bidirectional influence of defects and functional size ».
In Joint Conference of the 21st International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement (IWSM-MENSURA) (Nara, Japan, Nov. 3-4, 2011)
pp. 69-75.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Official URL: http://dx.doi.org/10.1109/IWSM-MENSURA.2011.21
Item Type: | Conference proceeding | ||
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ISBN: | 978-1-4577-1930-1 | ||
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Affiliation: | Génie logiciel et des technologies de l'information | ||
Date Deposited: | 18 Apr 2013 19:02 | ||
Last Modified: | 18 Apr 2013 19:02 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/4142 |
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