Thibeault, Claude.
1997.
« A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures ».
In 15th IEEE VLSI Test Symposium (Monterey, CA, USA, Apr. 27-May 1, 1997)
pp. 80-85.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Official URL: http://dx.doi.org/10.1109/VTEST.1997.599445
| Item Type: | Conference proceeding | ||
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| ISBN: | 0-8186-7810-0 | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 18 Apr 2013 19:04 | ||
| Last Modified: | 18 Apr 2013 19:04 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/4715 |
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