Increasing current testing resolution

Thibeault, Claude. 1998. « Increasing current testing resolution ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998) pp. 126-134. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type:	Conference proceeding
ISBN:	0-8186-8832-7
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4716

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