Thibeault, Claude.
1998.
« Increasing current testing resolution ».
In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998)
pp. 126-134.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 4.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/DFTVS.1998.732159
| Item Type: | Conference proceeding | ||
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| ISBN: | 0-8186-8832-7 | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 18 Apr 2013 19:04 | ||
| Last Modified: | 18 Apr 2013 19:04 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/4716 |
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