Increasing current testing resolution

Thibeault, Claude. 1998. « Increasing current testing resolution ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998) pp. 126-134. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 4.

The full text of this document is not available here.

Item Type:	Conference proceeding
ISBN:	0-8186-8832-7
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4716

Actions (login required)

View Item