On the comparison of Δ IDDQ and IDDQ testing

Thibeault, Claude. 1999. « On the comparison of Δ IDDQ and IDDQ testing ». In 17th IEEE VLSI Test Symposium (Dana Point, CA, USA, Apr. 25-29, 1999) pp. 143-150. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type:	Conference proceeding
ISBN:	0-7695-0146-X
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	11 Jul 2022 18:23
URI:	https://espace2.etsmtl.ca/id/eprint/4717

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