Thibeault, Claude.
1999.
« An histogram based procedure for current testing of active defects ».
In International Test Conference (Atlantic City, NJ, USA, Sept. 28-30, 1999)
pp. 714-723.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 61.
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Official URL: http://dx.doi.org/10.1109/TEST.1999.805800
Item Type: | Conference proceeding |
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ISBN: | 0-7803-5753-1 |
Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 18 Apr 2013 19:04 |
Last Modified: | 18 Apr 2013 19:04 |
URI: | https://espace2.etsmtl.ca/id/eprint/4718 |
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