Speeding-up IDDQ measurements

Thibeault, Claude. 2002. « Speeding-up IDDQ measurements ». In 20th IEEE VLSI Test Symposium (Monterey, CA, USA, Apr. 28-May 2, 2002) pp. 295-301. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type:	Conference proceeding
ISBN:	0-7695-1570-3
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4721

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