Thibeault, Claude et Boisvert, L..
1998.
« Diagnosis method based on Iddq probabilistic signatures : experimental results ».
In IEEE International Test Conference (Washington, DC, USA, Oct. 18-21, 1998)
pp. 1019-1026.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 20.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/TEST.1998.743299
| Item Type: | Conference proceeding | ||
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| ISBN: | 0-7803-5093-6 | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 18 Apr 2013 19:04 | ||
| Last Modified: | 18 Apr 2013 19:04 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/4725 |
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