Thibeault, Claude et Payeur, A..
1996.
« Experimental results from I-DDF testing ».
In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Boston, MA, USA, Nov. 6-8, 1996), pp. 185-193.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Official URL: http://dx.doi.org/10.1109/DFTVS.1996.572024
| Item Type: | Conference proceeding | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 18 Apr 2013 19:04 | ||
| Last Modified: | 18 Apr 2013 19:04 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/4726 |
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