FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Experimental results from I-DDF testing

Thibeault, Claude and Payeur, A.. 1996. « Experimental results from I-DDF testing ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Boston, MA, USA, Nov. 6-8, 1996) pp. 185-193. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
ISBN: 0-8186-7545-4
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: https://espace2.etsmtl.ca/id/eprint/4726

Actions (login required)

View Item View Item