Experimental results from I-DDF testing

Thibeault, Claude et Payeur, A.. 1996. « Experimental results from I-DDF testing ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Boston, MA, USA, Nov. 6-8, 1996) pp. 185-193. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type:	Conference proceeding
ISBN:	0-8186-7545-4
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4726

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