Tolerance control with high resolution 3D measurements

Prieto, Flavio, Redarce, Tanneguy, Boulanger, Pierre and Lepage, Richard. 2001. « Tolerance control with high resolution 3D measurements ». In 3ird International Conference on 3-D Digital Imaging and Modeling (Quebec, QC, Canada, May 28-June 1, 2001) pp. 339-346. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 6.

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Item Type:	Conference proceeding
Professor:	Professor Lepage, Richard
Affiliation:	Génie de la production automatisée
Date Deposited:	24 Jul 2013 20:42
Last Modified:	24 Jul 2013 20:42
URI:	https://espace2.etsmtl.ca/id/eprint/4957

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