Tools for the characterization of bipolar CML testability

Monte, Ginette, Antaki, Bernard, Patenaude, Serge, Savaria, Yvon, Thibeault, Claude and Trouborst, Pieter. 2001. « Tools for the characterization of bipolar CML testability ». In 19th IEEE VLSI Test Symposium (VTS) (Marina Del Rey, CA, USA, Apr. 29-May 3, 2001) pp. 388-395. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 1.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	24 Jul 2013 20:42
Last Modified:	24 Jul 2013 20:42
URI:	https://espace2.etsmtl.ca/id/eprint/4974

Actions (login required)

View Item