Bing, Qiu, Savaria, Yvon, Meng, Lu, Chunyan, Wang et Thibeault, Claude.
2002.
« Yield modeling of a WSI telecom router architecture ».
In 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Vancouver, BC, Canada, Nov. 6-8, 2002)
pp. 314-321.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Official URL: http://dx.doi.org/10.1109/DFTVS.2002.1173528
Item Type: | Conference proceeding | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 24 Jul 2013 20:43 | ||
Last Modified: | 15 Aug 2014 14:46 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/5034 |
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