Yield modeling of a WSI telecom router architecture

Bing, Qiu, Savaria, Yvon, Meng, Lu, Chunyan, Wang et Thibeault, Claude. 2002. « Yield modeling of a WSI telecom router architecture ». In 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Vancouver, BC, Canada, Nov. 6-8, 2002) pp. 314-321. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Official URL: http://dx.doi.org/10.1109/DFTVS.2002.1173528

Item Type:

Conference proceeding

Professor:

Professor
Thibeault, Claude

Affiliation:

Génie électrique

Date Deposited:

24 Jul 2013 20:43

Last Modified:

15 Aug 2014 14:46

URI:

https://espace2.etsmtl.ca/id/eprint/5034

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