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Yield modeling of a WSI telecom router architecture

Bing, Qiu, Savaria, Yvon, Meng, Lu, Chunyan, Wang et Thibeault, Claude. 2002. « Yield modeling of a WSI telecom router architecture ». In 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Vancouver, BC, Canada, Nov. 6-8, 2002) pp. 314-321. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 24 Jul 2013 20:43
Last Modified: 15 Aug 2014 14:46
URI: https://espace2.etsmtl.ca/id/eprint/5034

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