Electrical resistivity characterization of silicon carbide by various methods

Bouanga, C. Vanga, Savoie, S., Fréchette, M. F., Couderc, H. and David, Éric. 2012. « Electrical resistivity characterization of silicon carbide by various methods ». In Conference Record of the 2012 IEEE International Symposium on Electrical Insulation (ISEI) (San Juan, PR, USA, June 10-13, 2012 ) pp. 43-47. Piscataway, N.J. : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 7.

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Item Type:	Conference proceeding
ISBN:	01642006
Professor:	Professor David, Éric
Affiliation:	Génie mécanique
Date Deposited:	24 Jul 2013 20:44
Last Modified:	24 Jul 2013 20:44
URI:	https://espace2.etsmtl.ca/id/eprint/5223

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