Bouanga, C. Vanga, Savoie, S., Fréchette, M. F., Couderc, H. et David, Éric.
2012.
« Electrical resistivity characterization of silicon carbide by various methods ».
In Conference Record of the 2012 IEEE International Symposium on Electrical Insulation (ISEI) (San Juan, PR, USA, June 10-13, 2012 )
pp. 43-47.
Piscataway, N.J. : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 4.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/ELINSL.2012.6251423
Item Type: | Conference proceeding | ||
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ISBN: | 01642006 | ||
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Affiliation: | Génie mécanique | ||
Date Deposited: | 24 Jul 2013 20:44 | ||
Last Modified: | 24 Jul 2013 20:44 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/5223 |
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