Trudel, Sylvie et Abran, Alain.
2010.
« The contribution of functional size measurers in defects inspections : a case study with inexperienced measurers ».
International Journal of Computing and Information Sciences, vol. 11, nº 3.
The full text of this document is not available here.
Item Type: |
Peer reviewed article published in a journal
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Professor: |
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Affiliation: |
Génie logiciel et des technologies de l'information |
Date Deposited: |
23 May 2012 17:56 |
Last Modified: |
23 May 2012 17:56 |
URI: |
https://espace2.etsmtl.ca/id/eprint/544 |
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