Palza, Edgardo, Abran, Alain et Fuhrman, Christopher.
2004.
« V&V Measurements Management Issues in Safety-Critical Software ».
In Software Measurement - Research and Application : Proceedings of the International Workshop on Software Metrics and DASMA Software Metrik Kongress IWSM/MetriKon 2004 (Berlin, Germany, Nov. 2-5, 2004)
pp. 67-75.
Aachen, Germany : Shaker Verlag.
The full text of this document is not available here.
| Item Type: |
Conference proceeding
|
| Editors: |
| Abran, Alain | UNSPECIFIED | | Bundschuh, Manfred | UNSPECIFIED | | Büren, Günter | UNSPECIFIED | | Dumke, Reiner R. | UNSPECIFIED |
|
| Professor: |
| Abran, Alain | | Fuhrman, Christopher |
|
| Affiliation: |
Génie logiciel et des technologies de l'information |
| Date Deposited: |
04 Oct 2013 15:30 |
| Last Modified: |
10 Sep 2015 19:50 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/5891 |
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