Palza, Edgardo, Abran, Alain and Fuhrman, Christopher.
2004.
« V&V Measurements Management Issues in Safety-Critical Software ».
In Software Measurement - Research and Application : Proceedings of the International Workshop on Software Metrics and DASMA Software Metrik Kongress IWSM/MetriKon 2004 (Berlin, Germany, Nov. 2-5, 2004)
pp. 67-75.
Aachen, Germany : Shaker Verlag.
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| Item Type: | Conference proceeding |
|---|---|
| Editors: | Editors ORCID Abran, Alain UNSPECIFIED Bundschuh, Manfred UNSPECIFIED Büren, Günter UNSPECIFIED Dumke, Reiner R. UNSPECIFIED |
| Professor: | Professor Abran, Alain Fuhrman, Christopher |
| Affiliation: | Génie logiciel et des technologies de l'information |
| Date Deposited: | 04 Oct 2013 15:30 |
| Last Modified: | 19 Oct 2023 16:23 |
| URI: | https://espace2.etsmtl.ca/id/eprint/5891 |
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