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Tailoring of the electrical properties of silicon carbide for field grading application

Vanga-Bouanga, C., Heid, T. F., David, Éric, Frechette, M. F. et Savoie, S.. 2013. « Tailoring of the electrical properties of silicon carbide for field grading application ». In 2013 31st IEEE Electrical Insulation Conference (EIC 2013) (Ottawa, ON, Canada, June 2-5, 2013) pp. 263-266. Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Professor:
Professor
David, Éric
Affiliation: Génie mécanique
Date Deposited: 04 Dec 2013 19:07
Last Modified: 06 Dec 2013 19:16
URI: https://espace2.etsmtl.ca/id/eprint/6099

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