A methodology for system-level fault injection based on gate-level faulty behavior

Robache, R., Boland, Jean-François, Thibeault, Claude et Savaria, Y.. 2013. « A methodology for system-level fault injection based on gate-level faulty behavior ». In 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) (Paris, France, June 16-19, 2013) Piscataway, N. J., USA : IEEE.
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Official URL: http://dx.doi.org/10.1109/NEWCAS.2013.6573663

Item Type:

Conference proceeding

Professor:

Professor
Boland, Jean-François
Thibeault, Claude

Affiliation:

Génie électrique

Date Deposited:

12 Dec 2013 20:09

Last Modified:

05 Apr 2018 15:08

URI:

https://espace2.etsmtl.ca/id/eprint/6231

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