Robache, R., Boland, Jean-François, Thibeault, Claude et Savaria, Y..
2013.
« A methodology for system-level fault injection based on gate-level faulty behavior ».
In 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) (Paris, France, June 16-19, 2013)
Piscataway, N. J., USA : IEEE.
Compte des citations dans Scopus : 4.
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Official URL: http://dx.doi.org/10.1109/NEWCAS.2013.6573663
Item Type: | Conference proceeding | |||
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ISBN: | 978-1-4799-0618-5 | |||
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Affiliation: | Génie électrique | |||
Date Deposited: | 12 Dec 2013 20:09 | |||
Last Modified: | 05 Apr 2018 15:08 | |||
URI: | https://espace2.etsmtl.ca/id/eprint/6231 |
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