A methodology for system-level fault injection based on gate-level faulty behavior

Robache, R., Boland, Jean-François, Thibeault, Claude et Savaria, Y.. 2013. « A methodology for system-level fault injection based on gate-level faulty behavior ». In 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) (Paris, France, June 16-19, 2013) Piscataway, N. J., USA : IEEE.
Compte des citations dans Scopus : 4.

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Item Type:	Conference proceeding
ISBN:	978-1-4799-0618-5
Professor:	Professor Boland, Jean-François Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	12 Dec 2013 20:09
Last Modified:	05 Apr 2018 15:08
URI:	https://espace2.etsmtl.ca/id/eprint/6231

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