Lafleur, F., Thomas, Marc and Laville, Frédéric. 1998. « Modal analysis of electronic circuits using acoustical sources : methods, results and use ». Communication lors de la conférence : 4th (AST) Accelerated Stress Testing Workshop, IEEE (CPMT) Components, Packaging and Manufacturing Technology Society (Pasadena, CA, USA, Sept., 1998).
The full text of this document is not available here.| Item Type: | Communication (Communication) |
|---|---|
| Professor: | Professor Thomas, Marc Laville, Frédéric |
| Affiliation: | Génie mécanique |
| Date Deposited: | 26 Feb 2014 19:25 |
| Last Modified: | 03 Aug 2017 15:12 |
| URI: | https://espace2.etsmtl.ca/id/eprint/7151 |
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