Thibeault, Claude.
1995.
« Detection and location of faults and defects using digital signal processing ».
In Proceedings 13th IEEE VLSI Test Symposium (Los Alamitos, CA, USA, Apr. 30-May 3, 1995)
pp. 262-267.
IEEE Computer Society Press.
Compte des citations dans Scopus : 12.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/VTEST.1995.512647
Item Type: | Conference proceeding | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 27 Mar 2014 15:59 | ||
Last Modified: | 27 Mar 2014 15:59 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/7334 |
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