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An inexpensive method of testing localized parametric defects in static RAM

Savaria, Y. et Thibeault, Claude. 1993. « An inexpensive method of testing localized parametric defects in static RAM ». In Records of the 1993 IEEE International workshop on memory testing (San Jose, CA, USA, Aug. 9-10, 1993) pp. 90-95. Institute of Electrical and Electronics Engineers.
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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 23 Dec 2014 14:55
Last Modified: 23 Dec 2014 14:55
URI: https://espace2.etsmtl.ca/id/eprint/9210

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