An inexpensive method of testing localized parametric defects in static RAM

Savaria, Y. and Thibeault, Claude. 1993. « An inexpensive method of testing localized parametric defects in static RAM ». In Records of the 1993 IEEE International workshop on memory testing (San Jose, CA, USA, Aug. 9-10, 1993) pp. 90-95. Institute of Electrical and Electronics Engineers.
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Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	23 Dec 2014 14:55
Last Modified:	23 Dec 2014 14:55
URI:	https://espace2.etsmtl.ca/id/eprint/9210

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