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Comparing results from defect-tolerant yield models

Thibeault, Claude et Savaria, Y.. 1992. « Comparing results from defect-tolerant yield models ». In Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Dallas, TX, USA, Nov. 4-6, 1992) pp. 22-31. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers (IEEE).

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 23 Dec 2014 14:55
Last Modified: 23 Dec 2014 14:55
URI: https://espace2.etsmtl.ca/id/eprint/9234

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