Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation

Darvishi, Mostafa, Audet, Yves, Blaquière, Yves, Thibeault, Claude, Pichette, Simon and Tazi, Fatima Zahra. 2014. « Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation ». IEEE Transactions on Nuclear Science, vol. 61, nº 6. pp. 3535-3542.
Compte des citations dans Scopus : 6.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blaquière, Yves Thibeault, Claude
Affiliation:	Autres, Génie électrique
Date Deposited:	25 Feb 2015 21:50
Last Modified:	20 Feb 2017 19:15
URI:	https://espace2.etsmtl.ca/id/eprint/9345

Actions (login required)

View Item