Darvishi, Mostafa, Audet, Yves, Blaquière, Yves, Thibeault, Claude, Pichette, Simon et Tazi, Fatima Zahra.
2014.
« Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation ».
IEEE Transactions on Nuclear Science, vol. 61, nº 6.
pp. 3535-3542.
Compte des citations dans Scopus : 6.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/TNS.2014.2369424
Item Type: | Peer reviewed article published in a journal | |||
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Affiliation: | Autres, Génie électrique | |||
Date Deposited: | 25 Feb 2015 21:50 | |||
Last Modified: | 20 Feb 2017 19:15 | |||
URI: | https://espace2.etsmtl.ca/id/eprint/9345 |
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