SIFT-Rank: Ordinal description for invariant feature correspondence

Toews, Matthew et Wells, William III. 2009. « SIFT-Rank: Ordinal description for invariant feature correspondence ». In IEEE Conference onComputer Vision and Pattern Recognition, 2009. CVPR 2009 (Miami, FL, USA, June 20-25, 2009) pp. 172-177. Piscataway, NJ, USA : IEEE Computer Society.
Compte des citations dans Scopus : 45.

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Item Type:	Conference proceeding
ISBN:	1063-6919
Professor:	Professor Toews, Matthew
Affiliation:	Autres
Date Deposited:	25 Jun 2015 15:45
Last Modified:	05 Feb 2016 22:18
URI:	https://espace2.etsmtl.ca/id/eprint/9750

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