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SIFT-Rank: Ordinal description for invariant feature correspondence

Toews, Matthew et Wells, William III. 2009. « SIFT-Rank: Ordinal description for invariant feature correspondence ». In IEEE Conference onComputer Vision and Pattern Recognition, 2009. CVPR 2009 (Miami, FL, USA, June 20-25, 2009) pp. 172-177. Piscataway, NJ, USA : IEEE Computer Society.
Compte des citations dans Scopus : 35.

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Item Type: Conference proceeding
ISBN: 1063-6919
Professor:
Professor
Toews, Matthew
Affiliation: Autres
Date Deposited: 25 Jun 2015 15:45
Last Modified: 05 Feb 2016 22:18
URI: https://espace2.etsmtl.ca/id/eprint/9750

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