MOSFET threshold extraction from voltage-only measurements

Galup-Montoro, C., Schneider, M. C., Koerich, A. L. et Pinto, R. L. O.. 1994. « MOSFET threshold extraction from voltage-only measurements ». Electronics Letters, vol. 30, nº 17. pp. 1458-1459.
Compte des citations dans Scopus : 7.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Lameiras Koerich, Alessandro
Affiliation:	Autres
Date Deposited:	06 Jul 2015 19:46
Last Modified:	09 Feb 2016 21:02
URI:	https://espace2.etsmtl.ca/id/eprint/9779

Actions (login required)

View Item