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MOSFET threshold extraction from voltage-only measurements

Galup-Montoro, C., Schneider, M. C., Koerich, A. L. and Pinto, R. L. O.. 1994. « MOSFET threshold extraction from voltage-only measurements ». Electronics Letters, vol. 30, nº 17. pp. 1458-1459.
Compte des citations dans Scopus : 7.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Lameiras Koerich, Alessandro
Affiliation: Autres
Date Deposited: 06 Jul 2015 19:46
Last Modified: 09 Feb 2016 21:02
URI: https://espace2.etsmtl.ca/id/eprint/9779

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