Galup-Montoro, C., Schneider, M. C., Koerich, A. L. et Pinto, R. L. O..
1994.
« MOSFET threshold extraction from voltage-only measurements ».
Electronics Letters, vol. 30, nº 17.
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Compte des citations dans Scopus : 7.
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Official URL: http://dx.doi.org/10.1049/el:19940979
Item Type: | Peer reviewed article published in a journal | ||
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Affiliation: | Autres | ||
Date Deposited: | 06 Jul 2015 19:46 | ||
Last Modified: | 09 Feb 2016 21:02 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/9779 |
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