Cavalin, P., Oliveira, L. S., Koerich, A. L. et Britto, A. S..
2006.
« Wood defect detection using grayscale images and an optimized feature set ».
In IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics (Paris, France, Nov. 6-10, 2006)
pp. 3408-3412.
Compte des citations dans Scopus : 20.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/IECON.2006.347618
Item Type: | Conference proceeding | ||
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ISBN: | 1553-572X | ||
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Affiliation: | Autres | ||
Date Deposited: | 07 Jul 2015 15:59 | ||
Last Modified: | 09 Feb 2016 21:02 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/9816 |
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