MOSFET threshold extraction from voltage-only measurements

Schneider, M. C., Galup-Montoro, C., Koerich, A. L. and Pinto, R. L. O.. 1994. « MOSFET threshold extraction from voltage-only measurements ». In IX Brazilian Microelectronics Congress (SBMICRO'1994) (Rio de Janeiro, Brazil, Aug., 1994) pp. 216-222.
Compte des citations dans Scopus : 7.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Lameiras Koerich, Alessandro
Affiliation:	Autres
Date Deposited:	07 Jul 2015 15:59
Last Modified:	09 Feb 2016 21:02
URI:	https://espace2.etsmtl.ca/id/eprint/9859

Actions (login required)

View Item