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MOSFET threshold extraction from voltage-only measurements

Schneider, M. C., Galup-Montoro, C., Koerich, A. L. et Pinto, R. L. O.. 1994. « MOSFET threshold extraction from voltage-only measurements ». In IX Brazilian Microelectronics Congress (SBMICRO'1994) (Rio de Janeiro, Brazil, Aug., 1994) pp. 216-222.
Compte des citations dans Scopus : 7.

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Item Type: Conference proceeding
Professor:
Professor
Lameiras Koerich, Alessandro
Affiliation: Autres
Date Deposited: 07 Jul 2015 15:59
Last Modified: 09 Feb 2016 21:02
URI: https://espace2.etsmtl.ca/id/eprint/9859

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